JOURNAL ARTICLE
Electronic trap detection with carrier-resolved photo-Hall effect
Oki Gunawan, Chaeyoun Kim, Bonfilio Nainggolan, Minyeul Lee, Jonghwa Shin, Dong Suk Kim, Yimhyun Jo, Minjin Kim, Julie Euvrard, Douglas Bishop, Frank Libsch, Teodor Todorov, Yunna Kim, Byungha Shin
Science Advances
12 (1),
eadz0460
(2026)